{"product_id":"yield-and-reliability-in-microwave-circuit-and-system-design-hardcover","title":"Yield and Reliability in Microwave Circuit and System Design - Hardcover","description":"\u003cdiv\u003e\u003cp style=\"text-align: right;\"\u003e\u003ca href=\"https:\/\/reportcopyrightinfringement.com\/\" target=\"_blank\" rel=\"nofollow\"\u003e\u003cb\u003eReport copyright infringement\u003c\/b\u003e\u003c\/a\u003e\u003c\/p\u003e\u003c\/div\u003e\u003cp\u003eby \u003cb\u003eMichael D. Meehan\u003c\/b\u003e (Author), \u003cb\u003eJohn Purviance\u003c\/b\u003e (Joint Author), \u003cb\u003eMichael D. Meehan\u003c\/b\u003e (Preface by)\u003c\/p\u003e\u003cp\u003eThis reference is for anyone involved with microwave design. It tackles the practical aspects of microwave statistical design and introduces statistical design techniques that encompass many different applications. This presentation focuses on two main example areas - microwave circuits and systems - but any application with a complex relation between design variables and performance and design variable uncertainty can benefit from statistical design.\u003c\/p\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eNumber of Pages:\u003c\/strong\u003e 300\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eDimensions:\u003c\/strong\u003e 0.84 x 9.34 x 6.25 IN\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003eIllustrated:\u003c\/strong\u003e Yes\u003c\/div\u003e\n            \u003cdiv\u003e\n\u003cstrong\u003ePublication Date:\u003c\/strong\u003e December 19, 1993\u003c\/div\u003e\n            ","brand":"BooksCloud","offers":[{"title":"Default Title","offer_id":53344799293747,"sku":"9780890065273","price":170.71,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0300\/5595\/6612\/files\/AO8mgooHjW9780890065273.webp?v=1778732183","url":"https:\/\/www.vysn.com\/products\/yield-and-reliability-in-microwave-circuit-and-system-design-hardcover","provider":"VYSN","version":"1.0","type":"link"}